DieYieldIQ

DieYieldIQ is a web app (with optional desktop agent) that ingests wafer sort, probe, and final test logs to automatically surface the top yield detractors by lot, tool, and time window. It focuses on practical triage: clustering failing die maps, correlating failures with tool recipes and maintenance events, and generating a short, actionable “next checks” list for process and test engineers. This is an AI + traditional app: AI helps detect patterns and anomalies, but the UI stays grounded in familiar semiconductor workflows (lots, wafers, bins, parametric limits). The product is not a full MES or data lake replacement; it’s a thin layer that connects to what fabs and OSATs already have and produces faster answers. Expect some integration pain, but the value is measured in reduced time-to-root-cause and fewer bad lots shipped.